Abstract: In order to solve the problem that the sampling clock offset mismatch has a great impact on the performance of multiphase time interleaved sampling analog-to-digital converter (TI-ADC), a phase error extraction technique that cross-correlates the output of the sampling channel and uses the first-order Taylor expansion for adaptive compensation calibration is proposed, which effectively compensates for the multi-channel timing mismatch. Based on the 65 nm CMOS process, a 12 bit 1.6 GS/s eight-phase TI-ADC sampling phase mismatch calibration circuit was designed. When the input signal frequency is 626.562 5 MHz, the effective number of bits of the calibrated TI-ADC is increased by 6.29 bit, the signal-to-noise distortion ratio is increased by 38.1 dB, and the spurious-free dynamic range is increased by 44.44 dB. The design results show that the proposed technology has a simple structure and low hardware resource consumption, which can significantly improve the sampling performance of TI-ADC system.